■ The LETID system is a system used to test the performance degradation of photovoltaic modules under high temperature and lighting conditions. LETID (Light and elevated Temperature Induced Degradation) refers to the performance degradation phenomenon of photovoltaic modules under high temperature and lighting conditions, which can have a negative impact on the power generation efficiency of the modules. The working principle and function of the LETID system. The LeTID system simulates high temperature and lighting conditions to test the performance changes of photovoltaic modules under long-term high irradiation and high temperature environments. The system typically includes the following functions:

■ TC Thermal Cycle Test:Simulate the thermal cycling of components at different temperatures to evaluate their heat resistance performance.

■ HF wet freezing test：Performance changes of test components in wet and frozen environments。

■ High temperature attenuation test under LETID illumination：Test the performance degradation of components under high temperature and light conditions。