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PID testing system

PID testing system
  • PID testing system

PID testing system

The full name of PID effect (potential induced degradation) is potential induced decay, and the PID testing standard is derived from IEC62804-1: System Voltage durability test for crystalline silicon modules, The testing requirement is to...

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测试条件

 The full name of PID effect (potential induced degradation) is potential induced decay, and the PID testing standard is derived from IEC62804-1: System Voltage durability test for crystalline silicon modules, The testing requirement is to place the component in a certain temperature and humidity environment, connect the internal conductor of the component to one stage of the high-voltage power supply, and connect the external conductor of the component to the other pole of the high-voltage power supply.

 The testing conditions are as follows::

 
Functional characteristicsFunctional characteristics
  • This PID power supply requires multi-channel output, the ability to provide multiple components for simultaneous testing, continuous voltage adjustment, and real-time display of voltage parameters for easy monitoring (the number of channels can be adjusted according to customer needs).
  • The power supplies are independent of each other and can output different polarities and voltage values at the same time (the number of channels can be adjusted according to customer needs).
  • The system has a current display function, and multiple channels of current are displayed simultaneously (the number of channels can be adjusted according to customer needs).
  • One click switching of positive and negative polarity performance, safe and efficient.
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  • Each output or input channel terminal hole must be easy to plug and unplug for wiring (convenient, safe)
  • The component frame is grounded, and the connector is short circuited and connected to the high voltage end. During negative pressure testing and positive pressure recovery, only software switching is required without changing the connection method (the positive and negative poles of the power supply can achieve arc free conversion). Simulate the positive or negative grounding of the system (capable of conducting PID testing and PID recovery testing).
  • The power supply has a leakage current alarm function, and the alarm range can be set; (0~100 microamperes/-100~0 microamperes).
  • You can set the testing time, and the power system will automatically stop after the experiment ends.
 
Performance parameterPerformance parameter
Input power supply AC 220V±10%50HZ
Output voltage DC -2500V  to  +2500V (Continuing Adjust)
Voltage resolution 1V
Voltage accuracy 1000V 1500V 2000V Voltage fluctuation within 500 hours of continuous output≤2%
Maximum rated current 250 microamperes per channel
current accuracy 2 microamperes+1% range
Leakage current resolution 0.01uA
Protector Overcurrent, overvoltage, overtemperature, and short circuit protection
cooling Fan forced cooling
Sales records of the same type of equipmentSales records of the same type of equipment

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Accumulated sales quantity>224 sets


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